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electronics and communication engineering exam question papers
1. A silicon wafer has 100 nm of oxide it and is inserted in a furnace at a temperature above 1000°C for further oxidation in dry oxygen. The oxidation rate
(A): is independent of current oxide thickness and temperature
(B): is independent of current oxide thickness but depends on temperature
(C): is zero as the existing oxide prevents further oxidation
(D): slows down as the oxide grows
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